The DME AFM/MFM implements an AFM-based system suitable for topographical and magnetic imaging, in both static and dynamic operational modes.
This Scanning Force Microscopy can be used as Magnetic Force Microscopy (MFM)
measuring tip-sample magnetic interactions by means of a tip having ferromagnetic coating (such as Co-Cr) .
MFM probe can be used to work in both AC and DC-AFM mode.
AC-AFM mode usually provides better image quality (because environmental noises have less affect on the AC mode).
- contact/non-contact/intermittent contact mode.
- magnetic force microscopy
Back to Main Page