Microscopies and surface characterization
The WiTec AlphaSNOM implements a combined AFM and SNOM microscopy in collection/illumination and scattering mode by employing microfabricated, hollow pyramidal probes.
The system can also be used as a reflection/transmission confocal microscope. Both Near-field and confocal operational mode can benefit of a dispersive element spectrometer. Fluorescence and Raman images can be performed.
Available laser source
Spatial lateral resolution attained
- Doubled frequency Nd:YAG laser, 20 mW power.
- Optical: SNOM, 50 nm; Confocal, 300 nm
Available spectrometer grating
- Topographical: AFM, <10 nm.
- 1200 lines/mm, 2400 lines/mm.
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