Characterizations
X-ray Photoemission Spectroscopy
The PHI scanning x-ray microprobe technology allows:
- High sensitivity micro area analysis
- Chemical state imaging
- X-ray induced secondary electron imaging
- High performance sputter depth profiling
- Patented dual beam charge neutralization
- Floating column argon ion gun
- Five axis automated sample manipulator
- Angle dependent XPS (with ZALAR rotation)
- MultiPak data reduction software
- 25 mm and 60 mm sample handling
This Multi-Technique instrument platform accepts:
- UV light source for UPS
- Custom sample preparation chambers
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