Piezoelectric Characterization

aixACCT Piezo-Evaluation-System (aixPES)                                                                             

The aixPES system allows for both small signal measures as the capacity, the dielectric constant, the loss tangent, the piezoelectric coefficient (d33, d31) of the piezoelectric film as a function of bias voltage in continuous, both large signal measures as the electric polarization and displacement. In particular, the displacement is measured using a single beam laser interferometer (Polytec OFV-5000 Vibrometer Controller).