Conductive Atomic Force Microscopy

Bruker Innova equipped with Femto DLPCA-200 amplifier

 

The Bruker Innova atomic force microscope is designed and engineered to provide proper functionalities in different possible research fields. Coupled with the C-AFM module, composed by the Femto DLPCA-200 current amplifier, it ensures both accurate, high-resolution imaging and electrical probing.

Technical details about Innova AFM:

  • Sample size: 45 mm x 45 mm x 18 mm
  • Motorized Z travel: 18 mm, with pitch and tilt capability
  • Closed-loop, large-area scanner: XY > 5µm, Z > 7.5 µm
  • Z noise floor: < 50 pm RMS
  • Closed-loop XY noise: <1.2 nm RMS
  • Z linearizer noise: < 200 pm RMS
  • Open-loop XY drift: < 1 nm/min
  • Closed-loop WY drift: < 3 nm/min
  • Open-loop warm-up time: 15 min
  • 20-bit DAC scan control, 8 ADCs (100 kHz, ±10V)
  • Digital force and position feedback programmable via external signals
  • Integrated software-configurable signal access and routing
  • 2 full-digital lock-ins

Technical details about DPLCA-200:

  • Switchable gain from 103 to 1011 V/A
  • Gain accuracy: ±1%
  • Bandwith: 500 kHz
  • Protection against ±3 kV transients
  • Maximum input voltage range: (-16, +12) V
  • Maximum input current: 35 mA
  • Output impedance: 50 Ω