Conductive Atomic Force Microscopy
Bruker Innova equipped with Femto DLPCA-200 amplifier
The Bruker Innova atomic force microscope is designed and engineered to provide proper functionalities in different possible research fields. Coupled with the C-AFM module, composed by the Femto DLPCA-200 current amplifier, it ensures both accurate, high-resolution imaging and electrical probing.
Technical details about Innova AFM:
- Sample size: 45 mm x 45 mm x 18 mm
- Motorized Z travel: 18 mm, with pitch and tilt capability
- Closed-loop, large-area scanner: XY > 5µm, Z > 7.5 µm
- Z noise floor: < 50 pm RMS
- Closed-loop XY noise: <1.2 nm RMS
- Z linearizer noise: < 200 pm RMS
- Open-loop XY drift: < 1 nm/min
- Closed-loop WY drift: < 3 nm/min
- Open-loop warm-up time: 15 min
- 20-bit DAC scan control, 8 ADCs (100 kHz, ±10V)
- Digital force and position feedback programmable via external signals
- Integrated software-configurable signal access and routing
- 2 full-digital lock-ins
Technical details about DPLCA-200:
- Switchable gain from 103 to 1011 V/A
- Gain accuracy: ±1%
- Bandwith: 500 kHz
- Protection against ±3 kV transients
- Maximum input voltage range: (-16, +12) V
- Maximum input current: 35 mA
- Output impedance: 50 Ω